NDLI: /spl gamma/-radiation dosimetry using screen printed nickel oxide thick films

Content Provider	IEEE Xplore Digital Library
Author	Arshak, K. Korostynska, O. Harris, J.
Copyright Year	2002
Description	Author affiliation: Dept. of Electron. & Comput. Eng., Limerick Univ., Ireland (Arshak, K.; Korostynska, O.; Harris, J.)
Abstract	Thick films of nickel oxide (NiO) were investigated for /spl gamma/-radiation dosimetry purposes. Samples were fabricated using the thick film screen printing technique. Absorption spectra for NiO films were recorded and the values of the optical band gap for as-printed, irradiated and annealed films were calculated. It was found that the optical band gap value decreased as the radiation dose was increased. Samples with an Ag-NiO-Ag sandwich structure were exposed to a /sup 60/Co /spl gamma/-radiation source at a dose rate of 6 Gy/min. The relative change in current increased linearly with increased dosage up to 720 Gy. The I-V characteristics indicated a Poole-Frenkel conduction mechanism. It was found that annealing restored both the electrical and the optical properties of the samples.
Sponsorship	IEEE Electron Devices Soc. IEEE-Solid-State Circuits Soc
Starting Page	357
Ending Page	360
File Size	246333
Page Count	4
File Format	PDF
ISBN	0780372352
DOI	10.1109/MIEL.2002.1003210
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2002-05-12
Publisher Place	Yugoslavia
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Dosimetry Nickel Optical films Thick films Optical recording Photonic band gap Annealing Printing Electromagnetic wave absorption Sandwich structures
Content Type	Text
Resource Type	Article

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