NDLI: High precision testing method of mixed signal device

Content Provider	IEEE Xplore Digital Library
Author	Watanabe, A. Maekawa, M. Hamada, M. Hirase, J.
Copyright Year	1994
Description	Author affiliation: Testing Technol. Section, Matsushita Electron., Nagaokakyo, Japan (Watanabe, A.; Maekawa, M.; Hamada, M.; Hirase, J.)
Abstract	Recent advances in semiconductor production technology have enabled the on-chip configuration of integrated circuit systems. This has resulted in the increase of mixed signal LSIs that contain digital LSIs and analog LSIs, that have up till now been produced individually, being integrated on a single chip. When compared with individual digital and analog tests up till now, mixed signal LSIs pose the following problems for high-precision testing. High-precision measurement is difficult due to peripheral noise as analog signals are handled, and the reproducibility of measurement results is poor. This paper describes a method of testing sigma-delta D/A converters and LCD driver LSIs using an example where the above problems in a mixed signal LSI were solved. When conducting high-precision measurement of sigma-delta D/A converters with a mixed signal tester, measurement at the same precision as when a high-precision tester is used is possible when the influence of clock jitter, the influence of the power supply, the influence of peripheral circuits, and the dynamic range of the measurement system are taken into consideration. With respect to LCD driver LSIs, this paper describes testing problems and two inspection methods, the differential comparator system and the digitizer system.
Starting Page	1284
Ending Page	1288
File Size	400211
Page Count	5
File Format	PDF
ISBN	0780318803
DOI	10.1109/IMTC.1994.351821
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1994-05-10
Publisher Place	Japan
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Circuit testing Power measurement System testing Noise measurement Semiconductor device measurement Delta-sigma modulation Production systems Integrated circuit technology System-on-a-chip Semiconductor device noise
Content Type	Text
Resource Type	Article

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