NDLI: Bandwidth Modelling for Distributed On-Chip RLCG Interconnect Considering Coupling Effects

Content Provider	IEEE Xplore Digital Library
Author	Datta, M. Sahoo, S. Kar, R.
Copyright Year	2011
Abstract	With the increase in the levels of on-chip integration, the number of functional units integrated onto a single chip is rapidly increasing and as a result, the logic delays are decreasing due to faster transistors. At the same time, the local interconnect delays improve because the physical size of the circuit blocks decrease and the local interconnect spans shorter distances. On the other hand, the global interconnect delay increases with the technology scaling. Multiple design criteria are considered during the interconnect design process, such as delay, power, bandwidth and noise. Performance of any VLSI circuit depends on the bandwidth, as it decreases with the increase in the length of interconnects. Depending on the frequency range of operation, on-chip interconnect can be modelled as lumped and/or distributed RC line for low frequency and as a distributed RLC segments for high frequency. At even higher frequency, of the order of above 10GHz, the shunt conductance needs to be considered for accurate interconnect modelling. In this paper, on-chip interconnect has been modelled as distributed RLCG transmission lines, based on which a crosstalk aware bandwidth estimation method has been proposed in the transform domain in the presence of both inductive as well as capacitive coupling. First, the amount of crosstalk noise that would be induced on the victim line due to the transiting aggressor line has been analytically derived and then from the crosstalk noise voltage, a closed form expression for bandwidth has been proposed for distributed RLCG VLSI interconnects. The calculated bandwidth has been compared with the results obtained from that of SPICE simulation. The simulation shows that the proposed model could result an average error of as low as 15% when compared to the SPICE simulation.
Starting Page	1
Ending Page	5
File Size	333122
Page Count	5
File Format	PDF
ISBN	9781424491896
e-ISBN	9781424491902
DOI	10.1109/ICDECOM.2011.5738481
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2011-02-24
Publisher Place	India
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Couplings Inductance Power transmission lines Integrated circuit interconnections Crosstalk Bandwidth Capacitance
Content Type	Text
Resource Type	Article

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

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