NDLI: Enhanced Error Vector Magnitude (EVM) Measurements for Testing WLAN Transceivers

Content Provider	IEEE Xplore Digital Library
Author	Acar, E. Ozev, S. Redmond, K.B.
Copyright Year	2006
Description	Author affiliation: Duke Univ., Durham, NC (Acar, E.; Ozev, S.)
Abstract	As wireless LAN devices become more prevalent in the consumer electronics market, there is an ever increasing pressure to reduce their overall cost. The test cost of such devices is an appreciable percentage of the overall cost, which typically results from the high number of specifications, the high number of distinct test set-ups and equipment pieces that need to be used, and the high cost of each test set-up. In this paper, we investigate the versatility of EVM measurements to test the variable-envelope WLAN (wireless local area networks) receiver and transmitter characteristics. The goal is to optimize EVM test parameters (input data and test limits) and to reduce the number of specification measurements that require high test times and/or expensive test equipment. Our analysis shows that enhanced EVM measurements (optimized data sequence and limits, use of RMS, scale, and phase error vector values) in conjunction with a set of simple path measurements (input-output impedances) can provide the desired fault coverage while eliminating lengthy spectrum mask and noise figure tests
Starting Page	210
Ending Page	216
File Size	9631575
Page Count	7
File Format	PDF
ISBN	1595933891
ISSN	10923152
DOI	10.1109/ICCAD.2006.320138
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2006-11-05
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Association for Computing Machinery, Inc. (ACM)
Subject Keyword	Testing Wireless LAN Transceivers Costs Impedance measurement Length measurement Noise measurement Phase measurement Consumer electronics Area measurement
Content Type	Text
Resource Type	Article
Subject	Computer Graphics and Computer-Aided Design Computer Science Applications Software

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