Please wait, while we are loading the content...
Please wait, while we are loading the content...
| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Nicolics, J. Fasching, M. |
| Copyright Year | 2009 |
| Description | Author affiliation: Institute of Sensor and Actuator Systems, Vienna University of Technology, Gusshausstrasse 27-29, A-1040, Austria (Nicolics, J.) || mfTEC Fasching KEG, A-3033 Altlengbach, Maiss 10, Austria (Fasching, M.) |
| Abstract | A long-term resistance drift of wire-wound resistors or even a failure is frequently caused by short but repeated temperature peaks during pulse load operation. In this paper this aspect is investigated by comparison of two types of power wire-wound resistors with identical resistance value, nominal power, and size, but significantly different thermal behavior under pulse load condition. In order to capture the thermal cause as directly as possible a specific measuring circuit was developed to record the temperature as a function of time in the resistor wire during the dynamic cooling phase immediately after a pulse. In this way a peak temperature of e.g. 405°C was observed in one resistor type whereas the peak temperature in the other one at the same pulse load condition exceeded even 1000°C which is undoubtedly detrimental if periodically repeated. The measuring principle is presented in detail. The measuring accuracy is estimated and its meaning for the interpretation of the obtained results is shown. Based on these results the dependence of the pulse load resistivity of a wire-wound resistor on its interior structure is discussed. It is demonstrated that the pulse load performance can be improved significantly by increasing the thermal capacitance of the resistor wire without increasing the resistor size. |
| Starting Page | 1 |
| Ending Page | 5 |
| File Size | 2168900 |
| Page Count | 5 |
| File Format | |
| ISBN | 9781424442607 |
| DOI | 10.1109/ISSE.2009.5207023 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2009-05-13 |
| Publisher Place | Czech Republic |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Resistors Temperature Thermal resistance Thermal loading Pulse measurements Wire Electrical resistance measurement Phase measurement Time measurement Circuits |
| Content Type | Text |
| Resource Type | Article |
National Digital Library of India (NDLI) is a virtual repository of learning resources which is not just a repository with search/browse facilities but provides a host of services for the learner community. It is sponsored and mentored by Ministry of Education, Government of India, through its National Mission on Education through Information and Communication Technology (NMEICT). Filtered and federated searching is employed to facilitate focused searching so that learners can find the right resource with least effort and in minimum time. NDLI provides user group-specific services such as Examination Preparatory for School and College students and job aspirants. Services for Researchers and general learners are also provided. NDLI is designed to hold content of any language and provides interface support for 10 most widely used Indian languages. It is built to provide support for all academic levels including researchers and life-long learners, all disciplines, all popular forms of access devices and differently-abled learners. It is designed to enable people to learn and prepare from best practices from all over the world and to facilitate researchers to perform inter-linked exploration from multiple sources. It is developed, operated and maintained from Indian Institute of Technology Kharagpur.
Learn more about this project from here.
NDLI is a conglomeration of freely available or institutionally contributed or donated or publisher managed contents. Almost all these contents are hosted and accessed from respective sources. The responsibility for authenticity, relevance, completeness, accuracy, reliability and suitability of these contents rests with the respective organization and NDLI has no responsibility or liability for these. Every effort is made to keep the NDLI portal up and running smoothly unless there are some unavoidable technical issues.
Ministry of Education, through its National Mission on Education through Information and Communication Technology (NMEICT), has sponsored and funded the National Digital Library of India (NDLI) project.
| Sl. | Authority | Responsibilities | Communication Details |
|---|---|---|---|
| 1 | Ministry of Education (GoI), Department of Higher Education |
Sanctioning Authority | https://www.education.gov.in/ict-initiatives |
| 2 | Indian Institute of Technology Kharagpur | Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project | https://www.iitkgp.ac.in |
| 3 | National Digital Library of India Office, Indian Institute of Technology Kharagpur | The administrative and infrastructural headquarters of the project | Dr. B. Sutradhar bsutra@ndl.gov.in |
| 4 | Project PI / Joint PI | Principal Investigator and Joint Principal Investigators of the project |
Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon |
| 5 | Website/Portal (Helpdesk) | Queries regarding NDLI and its services | support@ndl.gov.in |
| 6 | Contents and Copyright Issues | Queries related to content curation and copyright issues | content@ndl.gov.in |
| 7 | National Digital Library of India Club (NDLI Club) | Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach | clubsupport@ndl.gov.in |
| 8 | Digital Preservation Centre (DPC) | Assistance with digitizing and archiving copyright-free printed books | dpc@ndl.gov.in |
| 9 | IDR Setup or Support | Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops | idr@ndl.gov.in |
|
Loading...
|