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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Morris, J.E. Tilford, T. Bailey, C. Sinclair, K.I. Desmulliez, M.P.Y. |
| Copyright Year | 2009 |
| Description | Author affiliation: Department of Electrical & Computer Engineering, Portland State University, OR 97207-0751, USA (Morris, J.E.) || MicroSystems Engineering Centre (MISEC), Heriot Watt University, Edinburgh EH14 4AS, UK (Sinclair, K.I.; Desmulliez, M.P.Y.) || School of Computing & Mathematical Sciences, University of Greenwich, London SE10 9LS, UK (Tilford, T.; Bailey, C.) |
| Abstract | A review of polymer cure models used in microelectronics packaging applications reveals no clear consensus of the chemical rate constants for the cure reactions, or even of an effective model. The problem lies in the contrast between the actual cure process, which involves a sequence of distinct chemical reactions, and the models, which typically assume only one, (or two with some restrictions on the independence of their characteristic constants.) The standard techniques to determine the model parameters are based on differential scanning calorimetry (DSC), which cannot distinguish between the reactions, and hence yields results useful only under the same conditions, which completely misses the point of modeling. The obvious solution is for manufacturers to provide the modeling parameters, but failing that, an alternative experimental technique is required to determine individual reaction parameters, e.g. Fourier transform infra-red spectroscopy (FTIR). |
| Starting Page | 1 |
| Ending Page | 6 |
| File Size | 1526614 |
| Page Count | 6 |
| File Format | |
| ISBN | 9781424442607 |
| DOI | 10.1109/ISSE.2009.5206929 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2009-05-13 |
| Publisher Place | Czech Republic |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Polymers Microelectronics Mathematical model Application software Microwave ovens Isothermal processes Chemicals Electric resistance Temperature dependence Packaging |
| Content Type | Text |
| Resource Type | Article |
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