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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Galliani, Silvano Lasinger, Katrin Schindler, Konrad |
| Copyright Year | 2015 |
| Abstract | We present a new, massively parallel method for high-quality multiview matching. Our work builds on the Patchmatch idea: starting from randomly generated 3D planes in scene space, the best-fitting planes are iteratively propagated and refined to obtain a 3D depth and normal field per view, such that a robust photo-consistency measure over all images is maximized. Our main novelties are on the one hand to formulate Patchmatch in scene space, which makes it possible to aggregate image similarity across multiple views and obtain more accurate depth maps. And on the other hand a modified, diffusion-like propagation scheme that can be massively parallelized and delivers dense multiview correspondence over ten 1.9-Megapixel images in 3 seconds, on a consumer-grade GPU. Our method uses a slanted support window and thus has no fronto-parallel bias, it is completely local and parallel, such that computation time scales linearly with image size, and inversely proportional to the number of parallel threads. Furthermore, it has low memory footprint (four values per pixel, independent of the depth range). It therefore scales exceptionally well and can handle multiple large images at high depth resolution. Experiments on the DTU and Middlebury multiview datasets as well as oblique aerial images show that our method achieves very competitive results with high accuracy and completeness, across a range of different scenarios. |
| Starting Page | 873 |
| Ending Page | 881 |
| File Size | 1643519 |
| Page Count | 9 |
| File Format | |
| ISSN | 23807504 |
| e-ISBN | 9781467383912 |
| DOI | 10.1109/ICCV.2015.106 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2015-12-07 |
| Publisher Place | Chile |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Three-dimensional displays Image reconstruction Surface reconstruction Robustness Benchmark testing Standards Image resolution |
| Content Type | Text |
| Resource Type | Article |
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