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Content Provider | IEEE Xplore Digital Library |
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Author | Umeda, H. Suzuki, A. Anda, Y. Ishida, M. Ueda, T. Tanaka, T. Ueda, D. |
Copyright Year | 2010 |
Description | Author affiliation: Advanced Technology Research Laboratories, Panasonic Corporation, 1 Kotari-yakemachi, Nagaokakyo, Kyoto 617-8520, JAPAN (Ueda, D.) || Semiconductor Device Research Center, Semiconductor Company, Panasonic Corporation, 1 Kotari-yakemachi, Nagaokakyo, Kyoto 617-8520, JAPAN (Umeda, H.; Suzuki, A.; Anda, Y.; Ishida, M.; Ueda, T.; Tanaka, T.) |
Abstract | We propose a novel technique to boost the blocking voltage of AlGaN/GaN hetero junction field effect transistors (HFETs) by widening a depletion layer in highly resistive Si substrate. The blocking-voltage boosting (BVB) technology utilizes ion implantation at the peripheral area of the chip as channel stoppers to terminate the leakage current from the interfacial inversion layers at AlN/Si. A depletion layer is widened in the substrate by the help of the channel stopper, which increases the blocking voltage of the HFET. The off-state breakdown voltage of the HFETs is increased up to 1340V by the BVB technology from 760V without the channel stoppers for the epitaxial GaN as thin as 1.4µm on Si. This technology greatly helps to increase the blocking voltage even for thin epitaxial GaN on Si, which leads to further reduction of the fabrication cost. |
File Size | 257030 |
File Format | |
ISBN | 9781442474185 |
ISSN | 2156017X |
e-ISBN | 9781424474202 |
e-ISBN | 9781424474196 |
DOI | 10.1109/IEDM.2010.5703400 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 2010-12-06 |
Publisher Place | USA |
Access Restriction | Subscribed |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | Silicon Gallium nitride Aluminum gallium nitride Substrates HEMTs MODFETs Epitaxial growth |
Content Type | Text |
Resource Type | Article |
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