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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Vettiger, P. Albrecht, T. Despont, M. Drechsler, U. Durig, U. Gotsmann, B. Jubin, D. Haberle, W. Lantz, M.A. Rothuizen, H. Stutz, R. Wiesmann, D. Binnig, G.K. Bachtold, P. Cherubini, G. Hagleitner, C. Loeliger, T. Pantazi, A. Pozidis, H. Eleftheriou, E. |
| Copyright Year | 2003 |
| Description | Author affiliation: Micro-/Nanomechanics Group, IBM Zurich Res. Lab., Ruschlikon, Switzerland (Vettiger, P.; Albrecht, T.; Despont, M.; Drechsler, U.; Durig, U.; Gotsmann, B.; Jubin, D.; Haberle, W.; Lantz, M.A.; Rothuizen, H.; Stutz, R.; Wiesmann, D.; Binnig, G.K.) |
| Abstract | Ultrahigh storage densities of up to 1 Tb/in./sup 2/ or more can be achieved by using local-probe techniques to write, read back, and erase data in very thin polymer films. The thermomechanical scanning-probe-based data-storage concept, internally dubbed "millipede", combines ultrahigh density, small form factor, and high data rates. High data rates are achieved by parallel operation of large 2D arrays with thousands micro/nanomechanical cantilevers/tips that can be batch-fabricated by silicon surface-micromachining techniques. The inherent parallelism, the ultrahigh areal densities and the small form factor may open up new perspectives and opportunities for application in areas beyond those envisaged today. |
| File Size | 345567 |
| File Format | |
| ISBN | 0780378725 |
| DOI | 10.1109/IEDM.2003.1269392 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2003-12-08 |
| Publisher Place | USA |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Material storage Atomic force microscopy Amorphous magnetic materials Polymer films Random access memory Image storage Magnetic confinement Magnetic memory Probes Laboratories |
| Content Type | Text |
| Resource Type | Article |
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