NDLI: The determination of equivalent constriction resistance and film resistance by using low DC voltages

Content Provider	IEEE Xplore Digital Library
Author	Takano, E.
Copyright Year	2004
Abstract	The change in a contact resistance due to the applied voltage is expressed by a formula, which indicates that this change is approximately proportional to the ratio of the constriction resistance to the film resistance in a series circuit model. It is possible to determine the equivalent values for the both these resistances by making use of the theory being presented and experimental data on the change in contact resistance. Experiments were conducted to measure the change in the contact resistances for cross wire contacts of Ag-Ag and Cu-Cu with a load of 0.1 to 1 N, when the contact voltage was decreased from /spl sim/15 mV to /spl sim/10 mV. It was found that the equivalent film resistance was about 70% of the total for high resistances (>1 /spl Omega/) and only 10 to 40% for low values (<0.01 /spl Omega/).
Sponsorship	Components, Packaging, and Manuf. Technol. Soc. of the Inst. of Electr. and Electron. Eng., Inc
Starting Page	192
Ending Page	198
File Size	825247
Page Count	7
File Format	PDF
ISBN	0780384601
DOI	10.1109/HOLM.2004.1353117
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2004-09-23
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Low voltage Contact resistance Thermal resistance Electrodes Electrical resistance measurement Temperature dependence Equivalent circuits Surface resistance Wire Insulation
Content Type	Text
Resource Type	Article

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