NDLI: An evaluation method of the contact erosion based on the DC mode test of electromagnetic contactor

Content Provider	IEEE Xplore Digital Library
Author	Kawakami, Y. Takashima, M. Hasegawa, M. Watanabe, Y. Sawa, K.
Copyright Year	2004
Description	Author affiliation: Dept. of Syst. Design Eng., Keio Univ., Yokohama, Japan (Kawakami, Y.; Takashima, M.)
Abstract	Electrical contacts are widely used for telecommunication and electric power systems as a device mechanically making and breaking electrical current. In the future, they can be still indispensable. Furthermore, the performance and reliability of electrical contacts must be more improved. Details of the mechanisms, however, have not completely been revealed yet, so that contact erosion and material transfer sometimes lead them to contact failure. We focus on two issues about contact erosion. In these years, volumetric method was proposed as the new evaluation method of surface erosion. However, few papers compare it with weighing method of measuring the mass change in detail. Hence, we investigated relationship between the number of switching operations and the amount of wear in electromagnetic contactor, and compared two methods. Furthermore, electromagnetic contactor is often used in the systems with an AC power supply. On the other hand, the DC mode test provides more fundamental data for us to investigate the electrical contacts than the AC mode test. We compared the data of the DC mode test with that of the AP mode test and described the possibility to estimate contact erosion with an AC power supply in terms of the DC mode test. The result of the DC mode agreed well with that of the AP mode in the case of low load current and a small operation number. We could also show an availability of volumetric method in early lifetime prediction.
Sponsorship	Components, Packaging, and Manuf. Technol. Soc. of the Inst. of Electr. and Electron. Eng., Inc
Starting Page	83
Ending Page	89
File Size	586252
Page Count	7
File Format	PDF
ISBN	0780384601
DOI	10.1109/HOLM.2004.1353099
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2004-09-23
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Testing Contacts Power supplies Rough surfaces Surface roughness Pollution measurement Design engineering Weight measurement Electromagnetic measurements Surface contamination
Content Type	Text
Resource Type	Article

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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