NDLI: Device-parameter estimation with on-chip variation sensors considering random variability

Content Provider	IEEE Xplore Digital Library
Author	Shinkai, K. Hashimoto, M.
Copyright Year	2011
Description	Author affiliation: Department of Information Systems Engineering, Osaka University, Osaka, Japan (Shinkai, K.; Hashimoto, M.)
Abstract	Device-parameter monitoring sensors inside a chip are gaining its importance as the post-fabrication tuning is becoming of a practical use. In estimation of variational parameters using on-chip sensors, it is often assumed that the outputs of variation sensors are not affected by random variations. However, random variations can deteriorate the accuracy of the estimation result. In this paper, we propose a device-parameter estimation method with on-chip variation sensors explicitly considering random variability. The proposed method derives the global variation parameters and the standard deviation of the random variability using the maximum likelihood estimation. We experimentally verified that the proposed method can accurately estimate variations, whereas the estimation result deteriorates when neglecting random variations. We also demonstrate an application result of the proposed method to test chips fabricated in a 65-nm process technology.
Starting Page	683
Ending Page	688
File Size	390013
Page Count	6
File Format	PDF
ISBN	9781424475155
ISSN	21536961
e-ISBN	9781424475162
DOI	10.1109/ASPDAC.2011.5722274
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2011-01-25
Publisher Place	Japan
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Sensors Silicon Accuracy Maximum likelihood estimation Sensitivity Semiconductor device measurement within-die variation variation sensor device-parameter extraction process variability die-to-die variation
Content Type	Text
Resource Type	Article

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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