NDLI: Semi-analytical current source modeling of near-threshold operating logic cells considering process variations

Content Provider	IEEE Xplore Digital Library
Author	Xie, Qing Cui, Tiansong Wang, Yanzhi Nazarian, Shahin Pedram, Massoud
Copyright Year	2013
Description	Author affiliation: University of Southern California, Department of Electrical Engineering, Los Angeles, United States, 90089 (Xie, Qing; Cui, Tiansong; Wang, Yanzhi; Nazarian, Shahin; Pedram, Massoud)
Abstract	Operating circuits in the ultra-low voltage regime results in significantly lower power consumption but can also degrade the circuit performance. In addition, it leads to higher sensitivity to various sources of variability in VLSI circuits. This paper extends the current source modeling (CSM) technique, which has successfully been applied to VLSI circuits to achieve very high accuracy in timing analysis, to the near-threshold voltage regime. In particular, it shows how to combine non-linear analytical models and low-dimensionality CSM lookup tables to simultaneously achieve modeling accuracy, space and time efficiency, when performing CSM-based timing analysis of VLSI circuits operating in near-threshold regime and subject to process variability effects.
Starting Page	447
Ending Page	450
File Size	314903
Page Count	4
File Format	PDF
ISBN	9781479929870
DOI	10.1109/ICCD.2013.6657079
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2013-10-06
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	process variation near-threshold computing statistical timing analysis current-source modeling
Content Type	Text
Resource Type	Article

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