NDLI: A new functional test program generation methodology

Content Provider	IEEE Xplore Digital Library
Author	Fallah, F. Takayama, K.
Copyright Year	2001
Description	Author affiliation: Fujitsu Labs. of America Inc, Sunnyvale, CA, USA (Fallah, F.)
Abstract	This paper introduces a new method for manually generating test programs to validate a processor design. Current manual methods do not utilize high level of abstraction for describing test programs and lack many important features like reusability, incremental validation, and test program compaction; they also work on a formal model specifically developed for validation purposes. To solve the above problems, we use test specification expressions to describe test programs and generate test sequences based on an instruction-set description of a processor written for synthesis purposes. We provide experimental results of generating test programs for several processors to show the effectiveness of our method.
Sponsorship	IEEE Comput. Soc.
Starting Page	76
Ending Page	81
File Size	645928
Page Count	6
File Format	PDF
ISBN	0769512003
ISSN	10636404
DOI	10.1109/ICCD.2001.955006
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2001-09-23
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Process design Assembly Productivity Writing Manuals Compaction Automatic testing Test pattern generators Digital systems Design methodology
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering Hardware and Architecture

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