NDLI: A novel temperature and disturbance insensitive DAC calibration method

Content Provider	IEEE Xplore Digital Library
Author	Bechthum, E. Radulov, G. van Roermund, A.
Copyright Year	2011
Description	Author affiliation: Eindhoven University of Technology, Department of Electrical Engineering, The Netherlands (Bechthum, E.; Radulov, G.; van Roermund, A.)
Abstract	This paper presents a new foreground DAC calibration method that is insensitive to temperature fluctuations and on-chip disturbances. In the proposed current cell, the same number of unit transistors is always used, guaranteeing matched response for all current cells. These transistors are divided in two groups: a fixed group and a configurable group. The unit transistors in the configurable group can be interchanged with additional redundant unit transistors, such that the mismatch errors of the configurable group compensate the mismatch errors of the fixed group. Together they generate the needed output current. Thus all current cells feature matched temperature coefficients and dynamic response. For an exemplary 6+6bits segmented current steering DAC, the expected 99% yield INL improves with almost 3 bits while using only 30% additional unit transistors.
Starting Page	2003
Ending Page	2006
File Size	276075
Page Count	4
File Format	PDF
ISBN	9781424494736
ISSN	02714302
e-ISBN	9781424494743
e-ISBN	9781424494729
DOI	10.1109/ISCAS.2011.5937988
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2011-05-15
Publisher Place	Brazil
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Transistors Calibration Linearity Temperature dependence Computer architecture Current measurement Microprocessors
Content Type	Text
Resource Type	Article

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