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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Won-Young Lee Lee-Sup Kim |
| Copyright Year | 2011 |
| Description | Author affiliation: Department of Electrical Engeering, KAIST, 335 Gwahangno, Yuseong-gu, Daejeon, Republic of Korea (Won-Young Lee; Lee-Sup Kim) |
| Abstract | This paper presents a 5.4 Gb/s clock and data recovery circuit using the seamless loop transition scheme which has no phase noise degradation. The controllable loop filter enables the CDR circuit to change the operation mode without the output phase noise degradation and the stability problem. The modified half-rate linear phase detector reduces the phase error between the data and clock. A tested chip is manufactured using 0.13 µm CMOS technology. The RMS jitter of the proposed CDR circuit is 5.98 ps-rms, which is 2.61 ps lower than the CDR circuit with the conventional scheme. The measured power dissipation is 138 mW with off-chip drivers at 5.4 Gb/s data rate. |
| Starting Page | 430 |
| Ending Page | 433 |
| File Size | 1570777 |
| Page Count | 4 |
| File Format | |
| ISBN | 9781424494736 |
| ISSN | 02714302 |
| e-ISBN | 9781424494743 |
| e-ISBN | 9781424494729 |
| DOI | 10.1109/ISCAS.2011.5937594 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2011-05-15 |
| Publisher Place | Brazil |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Phase noise Clocks Detectors Bandwidth Circuit stability Charge pumps |
| Content Type | Text |
| Resource Type | Article |
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