NDLI: Internal Fault Detection and Isolation for Paralleled Voltage Source Converters

Content Provider	IEEE Xplore Digital Library
Author	Di Zhang Wang, F. Burgos, R. Kern, J. El-Barbari, S. Boroyevich, D.
Copyright Year	2009
Description	Author affiliation: GE Global Research Center, Munich, Germany (El-Barbari, S.) \|\| Center for Power Electronic System, The Bradley Department of Electrical and Computer Engineering, Virginia Polytechnic Institute and State University, Blacksburg, VA 24060 USA (Di Zhang; Wang, F.; Burgos, R.; Boroyevich, D.) \|\| GE Global Research Center, Niskayuna, NY 12309, USA (Kern, J.)
Abstract	This paper presented a systematic analysis of the protection methods for paralleled VSCs system especially with common DC bus from four types of internal faults, including short or open circuit faults of single switch or diode. The potential damages of such faults relating to circulating current were first explained. After that internal faults detection and isolation schemes based on de-saturation and circulating currents were shown in detail. The study confirmed that if the system can be shut down for a short period, SCRs can be used to recovery the system from internal faults with one redundant VSC. Otherwise, the topology with isolated DC buses for each VSC or other fast DC current breakers should be used. Finally, experimental results using a 2+1 VSCs system validated the analysis and protection schemes.
Starting Page	833
Ending Page	839
File Size	7506691
Page Count	7
File Format	PDF
ISBN	9781424428113
ISSN	10482334
DOI	10.1109/APEC.2009.4802758
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-02-15
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Fault detection Voltage Converters Power conversion Circuit faults Electrical fault detection Protection Switches Switching circuits Diodes
Content Type	Text
Resource Type	Article

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