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Content Provider | IEEE Xplore Digital Library |
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Author | Kirby, B.J. Fitzsimmons, M.R. Borchers, J.A. Ge, Z. Liu, X. Furdyna, J.K. |
Copyright Year | 1965 |
Abstract | Mn/Ga1-xMnxAs bilayers can exhibit large exchange bias if annealed for an optimal period of time to transform the Mn cap into antiferromagnetic MnO. Annealing for too long tends to drastically increase the number of spins that become pinned along the direction of a cooling field, but it also results in samples that exhibit little or no exchange bias. To investigate why the increase in pinned spins does not enhance the exchange coupling, we used polarized neutron reflectometry to examine the magnetic depth profile of a typical overannealed Mn/Ga1-xMnxAs bilayer. We observe a large magnetization with a pinnable component distributed throughout the cap. This shows that overannealing results in a cap that is not entirely antiferromagnetic, and that the additional pinned spins do not originate from uncompensated moments directly at the antiferromagnet/ferromagnet interface-explaining why they do not contribute to the exchange bias coupling |
Sponsorship | IEEE Magnetics Society |
Starting Page | 3016 |
Ending Page | 3018 |
Page Count | 3 |
File Size | 339750 |
File Format | |
ISSN | 00189464 |
Volume Number | 43 |
Issue Number | 6 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 2007-06-01 |
Publisher Place | U.S.A. |
Access Restriction | One Nation One Subscription (ONOS) |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | Annealing Antiferromagnetic materials Magnetization SQUIDs Superconducting magnets Neutrons Cooling Semiconductor films Temperature dependence Magnetic devices neutron scattering Exchange bias magnetic semiconductors |
Content Type | Text |
Resource Type | Article |
Subject | Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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