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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Hong, S.Y. Shin, K.H. Lee, T.D. |
| Copyright Year | 1965 |
| Abstract | The effects of an rf substrate bias on the structural and magnetic properties of the CoCrPt/Cr/sub 75/Ti/sub 25//CoTi trilayer type longitudinal recording media deposited on glass substrate have been studied. It was found that the coercivity of 30 nm thick CoCrPt films deposited on Cr/sub 75/Ti/sub 25//CoTi underlayer was 4000 Oe by a substrate bias of 100 W rf, which is 800 Oe increase than the non-biased case. X-ray diffraction indicated that the rf-bias to substrate improved the Co (101~0) and (112~0) plane textures of the CoCrPt magnetic layer. From RES analyses, Pt content of the CoCrPt magnetic layer increased with rf-bias power. In addition to the Pt increase, a better lattice matching between the CoCrPt magnetic layer and the Cr/sub 75/Ti/sub 25//CoTi underlayer was obtained through the expansion of the lattice parameter, "a" and "c" of Co in the CoCrPt with the substrate bias. These two factors are thought to be the origin of the coercivity increase. |
| Sponsorship | IEEE Magnetics Society |
| Starting Page | 2664 |
| Ending Page | 2666 |
| Page Count | 3 |
| File Size | 282868 |
| File Format | |
| ISSN | 00189464 |
| Volume Number | 35 |
| Issue Number | 5 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1999-09-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Magnetic properties Chromium Magnetic films Substrates Sputtering Coercive force Magnetic recording Materials science and technology Glass X-ray diffraction |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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