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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Nakase, T. Nakano, M. Fujiwara, K. Takahashi, N. |
| Copyright Year | 1965 |
| Abstract | A single sheet tester having closed magnetic path (a closed type of SST) has a problem that measurement accuracy of magnetostriction is considerably affected by electromagnetic force between specimen and yoke. Therefore, an open type has been developed. In order to get uniform flux distribution in a sufficiently large region, a compensating magnetizing winding is installed, and a method of waveform control is investigated, in which applied voltages to main and compensating windings are adjusted individually. The effectiveness of the newly developed open type is demonstrated by measuring magnetostrictions of thin amorphous sheet as well as highly grain-oriented silicon steel sheet. |
| Sponsorship | IEEE Magnetics Society |
| Starting Page | 3956 |
| Ending Page | 3958 |
| Page Count | 3 |
| File Size | 248723 |
| File Format | |
| ISSN | 00189464 |
| Volume Number | 35 |
| Issue Number | 5 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1999-09-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Testing Magnetostriction Amorphous magnetic materials Magnetic flux Electromagnetic measurements Force measurement Electromagnetic forces Voltage control Amorphous materials Silicon |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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