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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Hirano, T. Namikawa, T. |
| Copyright Year | 1965 |
| Abstract | Nano-size Bi/sub 1.8/Y/sub 1.2/Fe/sub 5/O/sub 12/ particles were prepared with a coprecipitation and heat treatment method. The coating films of the particles were prepared with coating techniques. The crystalline sizes of the Bi/sub 1.8/Y/sub 1.2/Fe/sub 5/O/sub 12/ particles were calculated using the Scherrer equation with the X-ray diffraction data. The calculated size of the 0 h milling particle is about 400 nm that is almost the same as the measured size with a transmission electron microscope. The calculated particle size after 100 h milling is about 50 nm that is almost the same as the measured size with an atomic force microscope. The size of the prepared Bi/sub 1.8/Y/sub 1.2/Fe/sub 5/O/sub 12/ particles is changed with the milling process. The crystalline size calculation using the Scherrer equation with the X-ray diffraction data is a method of a size estimation of nano-size Bi/sub 1.8/Y/sub 1.2/Fe/sub 5/O/sub 12/ fine particles. |
| Sponsorship | IEEE Magnetics Society |
| Starting Page | 3487 |
| Ending Page | 3489 |
| Page Count | 3 |
| File Size | 243174 |
| File Format | |
| ISSN | 00189464 |
| Volume Number | 35 |
| Issue Number | 5 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1999-09-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Nanoparticles Bismuth Iron Milling Coatings Crystallization Equations X-ray diffraction Particle measurements Size measurement |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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