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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Liu, X.H. Yan, G. Cui, L.Y. Zhou, S.X. Zheng, W. Wang, A.L. Chen, J.C. |
| Copyright Year | 1965 |
| Abstract | The dependence of reduced remanence (Mr/Ms) and coercivity of Sm/sub 22/Co/sub 78//Fe/sub 65/Co/sub 35//Sm/sub 22/Co/sub 78/ triple-layer films on Fe/sub 65/Co/sub 35/ soft-magnetic interlayer thickness, d, was systematically investigated. All the hysteresis loops of the triple-layer films exhibit a single-phase behavior, reflecting a strong exchange coupling between soft- and hard-magnetic phases. Mr/Ms shows a monotonic increase with increasing the Fe/sub 65/Co/sub 35/ thickness, d, and the coercivity exists a peak with increasing d. From the plot of the interaction-based deviation parameter /spl Delta/M (H) of two principle remanence curves (isothermal remanence magnetization and dc-demagnetization remanence) versus applied field, H, a negative interaction profile was observed, indicating a negligible inter-granular exchange coupling within hard-magnetic grains. |
| Sponsorship | IEEE Magnetics Society |
| Starting Page | 3331 |
| Ending Page | 3333 |
| Page Count | 3 |
| File Size | 223469 |
| File Format | |
| ISSN | 00189464 |
| Volume Number | 35 |
| Issue Number | 5 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1999-09-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Remanence Coercive force Optical films Hysteresis Chromium Sputtering Magnetization Couplings Thickness control Control systems |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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