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Content Provider | IEEE Xplore Digital Library |
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Author | Verhoeven, M.A.J. Gerritsma, G.J. Rogalla, H. Golubov, A.A. |
Copyright Year | 2002 |
Abstract | Ramp type Josephson junctions have been fabricated using DyBa/sub 2/Cu/sub 3/O/sub 7-/spl delta// as electrode material and PrBa/sub 2/Cu/sub 3-x/Ga/sub x/O/sub 7-/spl delta// with x=0, 0.10 and 0.40 as junction barriers. Barrier thickness lie between 6-30 nm. Several junctions without barrier were made in order to find ways to minimize the damage of the ramp interface. In total about 40 chips were fabricated each containing several junctions and their I-V characteristics measured for various temperatures down to 4.2 K. Only those junctions showing clear RSJ-like curves were selected to be analyzed. In some cases we also measured I/sub c/ as a function of a small applied field and obtained a clear Fraunhofer pattern, but there is a tendency to flux trapping as evidenced by LTSEM. It was found at 4.2 K that the critical current density J/sub c/ scales with the specific resistance R/sub n/A as J/sub c/=C/sub bar/(R/sub n/A)/sup -m/ (m=1.8/spl plusmn/0.5). The barrier material dependent constant C/sub bar/ increases with x, whereas, for a given d, J/sub c/ is constant and R/sub n/A increases.< |
Sponsorship | Council on Superconductivity Appl. Superconductivity Conference Inc MIT |
Starting Page | 2095 |
Ending Page | 2098 |
Page Count | 4 |
File Size | 415849 |
File Format | |
ISSN | 10518223 |
Volume Number | 5 |
Issue Number | 2 |
Language | English |
Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Publisher Date | 1995-06-01 |
Publisher Place | U.S.A. |
Access Restriction | One Nation One Subscription (ONOS) |
Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
Subject Keyword | High temperature superconductors Josephson junctions Conductivity Electrodes Semiconductor device measurement Temperature measurement Thermal resistance Impurities Superconducting materials Solid state circuits |
Content Type | Text |
Resource Type | Article |
Subject | Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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