NDLI: USA interlaboratory comparison of superconductor simulator critical current measurements

Content Provider	IEEE Xplore Digital Library
Author	Goodrich, L.F. Wiejaczka, J.A. Srivastara, A.N. Stauffer, T.C. Medina, L.T.
Copyright Year	2002
Abstract	An interlaboratory comparison of critical current (I/sub c/) measurements was conducted on the superconductor simulator, which is an electronic circuit that emulates the extremely nonlinear voltage-current characteristic of a superconductor. These simulators are high precision instruments, and are useful for establishing the integrity of part of a superconductor measurement system. This study includes measurements from participating US laboratories, with NIST as the central, organizing laboratory. This effort was designed to determine the sources of uncertainty in I/sub c/ measurements due to uncertainties in the measurement apparatus, technique, or the analysis system. The participating laboratories measured the superconductor simulator with a variety of methods including DC and pulse. This comparison indicated the presence of systematic biases and higher variability at low voltages in the I/sub c/ determinations of the measurement systems. All critical current measurements at a criterion of 10 /spl mu/V on the I/sub c/ simulator were within 2% of the NIST value for nominal critical currents of 2 and 50 A. These results could significantly benefit superconductor measurement applications that require high-precision quality assurance.<>
Sponsorship	Council on Superconductivity Appl. Superconductivity Conference Inc MIT
Starting Page	548
Ending Page	551
Page Count	4
File Size	326378
File Format	PDF
ISSN	10518223
Volume Number	5
Issue Number	2
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1995-06-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Critical current Current measurement Circuit simulation Laboratories Particle measurements NIST Measurement uncertainty Pulse measurements Electronic circuits Voltage
Content Type	Text
Resource Type	Article
Subject	Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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