NDLI: High current densities and associated failure mechanisms in long narrow Tl/sub 2/Ba/sub 2/CaCu/sub 2/O/sub 8/ lines

Content Provider	IEEE Xplore Digital Library
Author	Holstein, W.L. Wilker, C. Pang, P.S.W. Laubacher, D.B. McKenna, S.P. Face, D.W.
Copyright Year	2002
Abstract	The use of high temperature superconducting thin films in chip-to-chip interconnects requires the fabrication of long, narrow lines capable of carrying high current density on large area films. The capability of Tl/sub 2/Ba/sub 2/CaCu/sub 2/O/sub 8/ thin films and patterning technology were studied for 0.65 /spl mu/m-thick films prepared on 2-and 3-inch diameter LaAlO/sub 3/ wafers. For 15, 12, and 10 /spl mu/m wide lines 1.8-2.0 m in length, critical current density J/sub c/ at 80 K in excess of 1.4 MA/cm/sup 2/ was achieved. Lines of length 70 cm and widths of 4 and 7 /spl mu/m yielded J/sub c/ at 80 K of 1.10 and 0.94 MA/cm/sup 2/ respectively. Patterning of long, continuous lines 2 /spl mu/m in width was difficult, but one such line 33.8 cm in length achieved a J/sub c/ of 1.2 MA/cm/sup 2/ at 70 K and another a J/sub c/ of 0.42 MA/cm/sup 2/ at 80 K. Line failure at high current density occurred through two mechanisms. Localized melting at high current density resulted in small localized line discontinuities. A second mechanism, postulated to be arcing, was characterized by melting and disfiguration over line lengths of up to several centimeters.<>
Sponsorship	Council on Superconductivity Appl. Superconductivity Conference Inc MIT
Starting Page	1693
Ending Page	1696
Page Count	4
File Size	528400
File Format	PDF
ISSN	10518223
Volume Number	5
Issue Number	2
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1995-06-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Failure analysis Current density Length measurement Critical current density Transistors Fabrication High temperature superconductors Superconducting materials Conductivity Density measurement
Content Type	Text
Resource Type	Article
Subject	Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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Transport critical current densities in bulk Tl/sub 2/Ba/sub 2/Ca/sub 2/Cu/sub 3/O/sub x/ and polycrystalline-thin-film Tl/sub 2/Ba/sub 2/Ca/sub 1/Cu/sub 2/O/sub x/: dependence on microstructure and neutron irradiation damage

Preparation and characterization of Tl/sub 2/Ba/sub 2/CaCu/sub 2/O/sub 8/ films on

Effect of substrate-twin-induced microstructure on transport properties of epitaxial Tl/sub 2/Ba/sub 2/CaCu/sub 2/O/sub x/ films in a magnetic field

Tl/sub 2/Ba/sub 2/CaCu/sub 2/O/sub 8/ and YBa/sub 2/Cu/sub 3/O/sub 7/ films on large area MgO and sapphire substrates for high power microwave and rf applications

Growth of TlBa/sub 2/CaCu/sub 2/O/sub 7/ thin films using a controlled Tl-oxide source during processing

Millimeter-Wave Radiation From Misaligned $ hbox{Tl}_{2}hbox{Ba}_{2}hbox{CaCu}_{2}hbox{O}_{8}$ Thin-Film Intrinsic Josephson Junctions

Transport properties of Tl/sub 2/Ba/sub 2/CaCu/sub 2/O/sub 8/ meander lines

Temporal stability of circulating current in thin film Tl/sub 2/Ba/sub 2/CaCu/sub 2/O/sub 8/ and YBa/sub 2/Cu/sub 3/O/sub 7/

Critical current densities for the high temperature ceramic superconductors YBa/sub 2/Cu/sub 3/O/sub 7/ and Bi/sub 2/Sr/sub 2/Ca/sub 2/Cu/sub 3/O/sub 10+ delta /

High current densities and associated failure mechanisms in long narrow Tl/sub 2/Ba/sub 2/CaCu/sub 2/O/sub 8/ lines

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Transport critical current densities in bulk Tl/sub 2/Ba/sub 2/Ca/sub 2/Cu/sub 3/O/sub x/ and polycrystalline-thin-film Tl/sub 2/Ba/sub 2/Ca/sub 1/Cu/sub 2/O/sub x/: dependence on microstructure and neutron irradiation damage

Preparation and characterization of Tl/sub 2/Ba/sub 2/CaCu/sub 2/O/sub 8/ films on

Effect of substrate-twin-induced microstructure on transport properties of epitaxial Tl/sub 2/Ba/sub 2/CaCu/sub 2/O/sub x/ films in a magnetic field

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Millimeter-Wave Radiation From Misaligned $ hbox{Tl}_{2}hbox{Ba}_{2}hbox{CaCu}_{2}hbox{O}_{8}$ Thin-Film Intrinsic Josephson Junctions

Transport properties of Tl/sub 2/Ba/sub 2/CaCu/sub 2/O/sub 8/ meander lines

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Critical current densities for the high temperature ceramic superconductors YBa/sub 2/Cu/sub 3/O/sub 7/ and Bi/sub 2/Sr/sub 2/Ca/sub 2/Cu/sub 3/O/sub 10+ delta /

High current densities and associated failure mechanisms in long narrow Tl/sub 2/Ba/sub 2/CaCu/sub 2/O/sub 8/ lines