NDLI: Effect of transverse compressive stress on the critical current of cabled Nb/sub 3/Sn conductor

Content Provider	IEEE Xplore Digital Library
Author	Jakob, B. Pasztor, G.
Copyright Year	1965
Abstract	A test apparatus has been designed and built for the investigation of cabled conductors subjected to transverse load. The apparatus permits measurement of compressive stress on a loaded multistage flat cable when a transport current is applied to one of its constituent subcables. With the apparatus, the critical-current behavior of a solder-filled Nb/sub 3/Sn cable made by the external diffusion method exposed to transverse loads up to 165 MPa, was investigated. A field-dependent degradation of the critical current was found. The effect is completely reversible up to about 100 MPa. Solder-filled cables as used in large-current applications are less sensitive to transverse compressive stress than single wires. A 150 MPa compressive load on the SULTAN cable, for example, degrades the critical current by 31% at 11 T. This is still a high enough value in view of the large transverse compressive stress acting on conductors required for fusion magnets.<>
Sponsorship	IEEE Magnetics Society
Starting Page	2379
Ending Page	2381
Page Count	3
File Size	320786
File Format	PDF
ISSN	00189464
Volume Number	25
Issue Number	2
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1989-03-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Compressive stress Critical current Conductors Degradation Testing Current measurement Stress measurement Niobium Tin Cables
Content Type	Text
Resource Type	Article
Subject	Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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