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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Bray, S.L. Ekin, J.W. Kuroda, T. |
| Copyright Year | 2002 |
| Abstract | The effect of transverse compressive stress and axial tensile stress on the critical current of multifilamentary Nb/sub 3/Al superconducting wires has been measured. Compared with commercial Nb/sub 3/Sn, Nb/sub 3/Al exhibits a relatively small sensitivity to both axial and transverse stress. For a given degradation of critical current at 9 T, Nb/sub 3/Al will tolerate about twice as much axial stress as Nb/sub 3/Sn and about five times the transverse stress. The elastic modulus of Nb/sub 3/Al, 169+or-20 GPa, was measured for the first time at cryogenic temperatures and found comparable to that of Nb/sub 3/Sn. A comparison between the effect of axial and transverse stress showed that Nb/sub 3/Al, like Nb/sub 3/Sn, is more sensitive to transverse stress than axial stress. For a given level of critical-current degradation, the transverse stress tolerance of Nb/sub 3/Al is about half the axial stress tolerance. The favorable electromechanical characteristics of Nb/sub 3/Al, compared with Nb/sub 3/Sn, may allow increased operating limits for the next generation of large high-field superconducting magnets.< |
| Sponsorship | Council on Superconductivity Appl. Superconductivity Conference Inc MIT |
| Starting Page | 1338 |
| Ending Page | 1341 |
| Page Count | 4 |
| File Size | 523308 |
| File Format | |
| ISSN | 10518223 |
| Volume Number | 3 |
| Issue Number | 1 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1993-03-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Degradation Niobium Tin Tensile stress Critical current Stress measurement Compressive stress Superconducting filaments and wires Current measurement Time measurement |
| Content Type | Text |
| Resource Type | Article |
| Subject | Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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