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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Ando, T. Nishi, M. Shimamoto, S. |
| Copyright Year | 1965 |
| Abstract | The stability margin of a single quadruplex of Nb/sub 3/Sn/Cu composite strand enclosed in a round stainless-steel tube was measured by using an inductive heater whose duration time is around 0.1 ms. The strand had a diameter of 1.04 mm and a copper fraction of 69%. The fraction of helium in the cable space was 34.5%. Measurements of the stability margin were carried out by varying the transport current, external magnetic field, and initial helium pressure. The helium flow rate was always zero. The limiting transport current, which is the boundary value between the upper and lower stable regions similar to NbTi cable-in-conduit conductors, was observed. The limiting-current density over the cable space inside the conduit at 12 T was 100 A/mm/sup 2/, corresponding to 58% of the critical current. This value does not depend on the initial helium pressure in the range of 3-12 atm. Observed upper and the lower stability margins were more than 200 mJ/cm/sup 3/ strand and less than 60 mJ/cm/sup 3/ strand, respectively. The heat transfer coefficient in the cable-in-conduit conductor is estimated to be around 0.1 W/cm/sup 2/K.< |
| Sponsorship | IEEE Magnetics Society |
| Starting Page | 2386 |
| Ending Page | 2389 |
| Page Count | 4 |
| File Size | 351568 |
| File Format | |
| ISSN | 00189464 |
| Volume Number | 25 |
| Issue Number | 2 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 1989-03-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Stability Niobium Copper Magnetic field measurement Conductors Tin Time measurement Current measurement Pressure measurement |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering |
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