NDLI: Study of Stability of Local Anodic Oxidation on HOPG and Few Layer Graphene Using AFM in Ambient

Content Provider	IEEE Xplore Digital Library
Author	Gowthami, T. Gadhewal, M. Raina, G.
Copyright Year	2002
Abstract	Local anodic oxidation (LAO) has been performed on highly oriented pyrolytic graphite (HOPG) and few layer graphene (FLG) using contact-mode (CM) atomic force microscopy (AFM) in a controlled humidity chamber. Different types of LAO patterns, namely, protrusion and trench features were observed for different tip speeds under similar conditions of LAO patterning, in both CM and noncontact-mode (NCM) AFM images. Observed LAO patterns show a variation in their dimensions over time. This paper carries out a study performed on the observed changes in dimensions of LAO patterns made on HOPG and FLG over several days, pointing to the dynamics of these LAO patterns. The stability of the LAO patterns on HOPG is compared with that for FLG. LAO patterns on HOPG show a widening and reduction in depth over a day. LAO patterns on FLG show, in contrast, a random variation in the lateral dimension “width” and stabilization in the vertical dimension “depth” over several days.
Sponsorship	IEEE Nanotechnology Council
Starting Page	1002
Ending Page	1006
Page Count	5
File Size	455462
File Format	PDF
ISSN	1536125X
Volume Number	12
Issue Number	6
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2013-01-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Graphene Lithography Humidity Force Educational institutions Oxidation local anodic oxidation (LAO) Atomic force microscopy (AFM) few layer graphene (FLG) highly oriented pyrolytic graphite (HOPG)
Content Type	Text
Resource Type	Article
Subject	Nanoscience and Nanotechnology Electrical and Electronic Engineering Computer Science Applications

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