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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Grybos, P. Maj, P. Ramello, L. Swientek, K. |
| Copyright Year | 1963 |
| Abstract | We present the measurements of matching and high count rate performance of a 64 channel readout ASIC called DEDIX for high count rate position-sensitive measurements using semiconductor detectors. The ASIC is designed in 0.35 mum CMOS process and its total area is 3900 times 5000 mum2. The DEDIX has a binary readout architecture. Each channel is built of a charge sensitive amplifier (CSA) with a pole-zero cancellation circuit, a shaper, two independent discriminators and two independent 20-bit counters. The size of the input device in CSA has been optimized for a detector capacitance in the range of 1-3 pF per strip. An equivalent noise charge of 110 el rms has been achieved for a total detector capacitance of 1 pF at the shaper peaking time of 160 ns. Internal correction DAC implemented in each channel independently ensures a low spread of discriminator effective threshold, namely 0.4 mV at one sigma level. The mean gain in the multichannel ASIC is 54 muV/el, with a good uniformity from channel-to-channel (sd/mean ap 0.8%). Low noise performance and high rate capability have been demonstrated by the measurement up to and above 1 MHz average rate of input signals. |
| Sponsorship | IEEE Nuclear and Plasma Sciences Society Computer Applications in Nuclear and Plasma Sciences (CANPS) Lawrence Berkeley Lab. Lawrence Livermore Nat. Lab. APS College of William and Mary Continuous Electron Beam Accelerator Facility NASA Defence Nuclear Agency Sandia National Laboratories Jet Propulsion Laboratory Brookhaven Nat. Lab. Lawrence Livermore Nat. Lab IEEE/NPPS Radiat. Effects Committee Defence Nuclear Agency/DoD Sandia National Laboratories/DOE Jet Propulsion Laboratory/NASA Phillips Lab./DoD |
| Starting Page | 1207 |
| Ending Page | 1215 |
| Page Count | 9 |
| File Size | 925206 |
| File Format | |
| ISSN | 00189499 |
| Volume Number | 54 |
| Issue Number | 4 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2007-08-01 |
| Publisher Place | U.S.A. |
| Access Restriction | One Nation One Subscription (ONOS) |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Application specific integrated circuits X-ray imaging Position measurement Capacitance Semiconductor device noise Position sensitive particle detectors CMOS process Counting circuits Strips Circuit noise matching Charge sensitive amplifier count rate |
| Content Type | Text |
| Resource Type | Article |
| Subject | Nuclear and High Energy Physics Electrical and Electronic Engineering Nuclear Energy and Engineering |
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