NDLI: A Multispectral Analog Photon-Counting Readout Circuit for X-ray Hybrid Pixel Detectors

Content Provider	IEEE Xplore Digital Library
Author	Perenzoni, M. Stoppa, D. Malfatti, M. Simoni, A.
Copyright Year	1963
Abstract	In this paper, an all-analog pixel architecture for the readout of X-ray pixel detectors with multiple energy discrimination is proposed. The circuit comprises a self-triggered reset charge amplifier and three distinct channels devoted to the detection on a specific energy band. Each channel is composed of an autocalibrated comparator, an energy window identification logic, and an analog counter with an adjustable dynamic range. A test prototype has been implemented with a standard complementary metal-oxide-semiconductor 0.35-mum technology. The pixel circuitry dissipates 15 muW at 3.3 V, has a noise equivalent charge of 82 e_rms ^- at 200 fF, and allows, on each of the three channels, a dynamic range that exceeds 12 bits. The designed pixel is a square with a 109-mum pitch.
Sponsorship	IEEE Instrumentation and Measurement Society Bureau international des poids et mesures IEEE International Bureau of Weights and Measures (BIPM) URSI NBS Agency Ind. Sci. & Technol., Min. Int. Trade & Ind. Sci. Council Japan International Union of Pure and Applied Physics (IUPAP) NIST NRCC National Conference of Standards Laboratories (NCSL) Allen Osborne Associates Andeen-Hagerling, Inc. Ballantine Lab. Inc. Clarke-Hess Communications Research Corp. Fluke Corporation Guildline Instruments Hewlett-Packard Co. Julie Res. Lab. Inc. Keithley Instruments, Inc. Measurements International Ltd. Canada QuadTech Inc. Quantum Design Inc. Rotek Instrum. Corp. Tegam Inc. Tektronix Inc
Starting Page	1438
Ending Page	1444
Page Count	7
File Size	832196
File Format	PDF
ISSN	00189456
Volume Number	57
Issue Number	7
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-07-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	X-ray detection X-ray detectors Counting circuits Semiconductor device noise X-ray imaging Dynamic range Integrated circuit noise Optical imaging Biomedical imaging Crystallography X-ray Analog counter charge amplifier energy window photon counting pixel detector
Content Type	Text
Resource Type	Article
Subject	Instrumentation Electrical and Electronic Engineering

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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