NDLI: Growth Condition Dependence of Microcracks in YBCO Thin Films Pulsed Laser Deposited on <inline-formula> <tex-math notation=TeX>$hbox{NdGaO}_{3}$</tex-math></inline-formula> (001) Substrates

Content Provider	IEEE Xplore Digital Library
Author	Palonen, H. Huhtinen, H. Paturi, P.
Copyright Year	2002
Abstract	The high-temperature superconductor YBCO is typically used as a thin film or coating in applications, but the brittle YBCO layer is often prone to develop small cracks, which reduce its performance. To better understand the crack formation and its connection to the uniaxial twinning state of YBCO on NdGaO₃ (001) substrates, a series of YBCO thin films has been grown by pulsed laser deposition with varying deposition temperature and growth rate. The structural properties of the samples are analyzed by atomic force microscopy and X-ray diffraction. The crack formation reduces the critical current densities, which have been measured magnetically. The results show a significant decrease in crack formation with decreased deposition temperature and also with decreased growth rate.
Sponsorship	Council on Superconductivity Appl. Superconductivity Conference Inc MIT
Starting Page	1
Ending Page	4
Page Count	4
File Size	1167027
File Format	PDF
ISSN	10518223
Volume Number	25
Issue Number	3
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2015-01-01
Publisher Place	U.S.A.
Access Restriction	One Nation One Subscription (ONOS)
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Yttrium barium copper oxide Temperature measurement Critical current density (superconductivity) Substrates Temperature Superconducting magnets Pulsed laser deposition crack formation YBCO thin films pulsed laser deposition Crack formation
Content Type	Text
Resource Type	Article
Subject	Condensed Matter Physics Electronic, Optical and Magnetic Materials Electrical and Electronic Engineering

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