NDLI: Leading-Indicators Based on Impedance Spectroscopy for Prognostication of Electronics Under Shock and Vibration Loads

Content Provider	The American Society of Mechanical Engineers (ASME) Digital Collection
Author	Lall, Pradeep Lowe, Ryan Suhling, Jeff Goebel, Kai
Copyright Year	2009
Abstract	Leading indicators of failure have been developed based on high-frequency characteristics, and system-transfer function derived from resistance spectroscopy measurements during shock and vibration. The technique is intended for condition monitoring in high reliability applications where the knowledge of impending failure is critical and the risks in terms of loss-of-functionality are too high to bear. Previously, resistance spectroscopy measurements [Constable 1992, Lizzul 1994, Prassana 1995] have been used during thermal cycling tests to monitor damage progression due to thermo-mechanical stresses. The development of resistance spectroscopy based damage pre-cursors for prognostication under shock and vibration is new. In this paper, the high-frequency characteristics, and system transfer function based on resistance spectroscopy measurements have been correlated with the damage progression in electronics during shock and vibration. Packages being examined include ceramic area-array packages. Second level interconnect technologies examined include copper-reinforced solder column, SAC305 solder ball, and 90Pb10Sn high-lead solder ball. Assemblies have been subjected to 1500g, 0.5 ms pulse [JESD-B2111]. Continuity has been monitored in-situ during the shock test for identification of part-failure. Resistance spectroscopy based damage pre-cursors have been correlated with the optically measured transient strain based feature vectors. High speed cameras have been used to capture the transient strain histories during shock-impact. Statistical pattern recognition techniques have been used to identify damage initiation and progression and determine the statistical significance in variance between healthy and damaged assemblies. Models for healthy and damaged packages have been developed based on package characteristics. Data presented shows that high-frequency characteristics and system-transfer characteristics based on resistance spectroscopy measurements can be used for condition-monitoring, damage initiation and progression in electronic systems. A positive prognostic distance has been demonstrated for each of the interconnect technologies tested.
Sponsorship	Electronic and Photonic Packaging Division
Starting Page	903
Ending Page	914
Page Count	12
File Format	PDF
ISBN	9780791843598
DOI	10.1115/InterPACK2009-89308
e-ISBN	9780791838518
Volume Number	ASME 2009 InterPACK Conference, Volume 1
Conference Proceedings	ASME 2009 InterPACK Conference collocated with the ASME 2009 Summer Heat Transfer Conference and the ASME 2009 3rd International Conference on Energy Sustainability
Language	English
Publisher Date	2009-07-19
Publisher Place	San Francisco, California, USA
Access Restriction	Subscribed
Subject Keyword	Spectroscopy Solders Vibration Transfer functions Electronics Ceramics Pattern recognition Stress Transients (dynamics) Thermomechanics Condition monitoring Electronic systems Shock (mechanics) Damage Copper Reliability Failure Electrochemical impedance spectroscopy
Content Type	Text
Resource Type	Article

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