NDLI: Measuring and improving the robustness of automotive smart power microelectronics

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Measuring and improving the robustness of automotive smart power microelectronics

Content Provider	ACM Digital Library
Author	Harrant, Manuel Kunze, Matthias Rafaila, Monica Nirmaier, Thomas zu Bexten, Volker Meyer Tristl, Markus Lau, Julia Pelz, Georg
Abstract	Automotive power micro-electronic devices in the past were low pin-count, low complexity devices. Robustness could be assessed by stressing the few operating conditions and by manual analysis of the simple analog circuitry. Nowadays complexity of Automotive Smart Power Devices is driven by the demands for energy efficiency and safety, which adds the need for additional monitoring circuitry, redundancy, power-modes, leading even to complex System-on-chips with embedded uC cores, embedded memory, sensors and other elements. Assessing the application robustness of this type of microelectronic devices goes hand-in-hand with exploring their verification space inside and to certain extends outside of the specification. While there are well established methods for standard functional verification, methods for application oriented robust verification are not yet available. In this paper we present promising directions and first results, to explore and assess device robustness through various pre- and post-Si verification and design exploration strategies, focusing on metamodeling, constrained-random verification and hardware-in-the-loop experiments, for exploration of the operating space.
Starting Page	872
Ending Page	873
Page Count	2
File Format	PDF
ISBN	9783981080186
Language	English
Publisher	Association for Computing Machinery (ACM)
Publisher Date	2012-03-12
Publisher Place	San Jose
Access Restriction	Subscribed
Subject Keyword	Constrained-random-verification Metamodeling Automotive smart power ic Robustness Component
Content Type	Text
Resource Type	Article

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