NDLI: Energy-efficient cache design using variable-strength error-correcting codes

Content Provider	ACM Digital Library
Author	Chishti, Zeshan Wilkerson, Chris Wu, Wei Lu, Shih-Lien Alameldeen, Alaa R. Wagner, Ilya
Abstract	Voltage scaling is one of the most effective mechanisms to improve microprocessors' energy efficiency. However, processors cannot operate reliably below a minimum voltage, Vccmin, since hardware structures may fail. Cell failures in large memory arrays (e.g., caches) typically determine Vccmin for the whole processor. We observe that most cache lines exhibit zero or one failures at low voltages. However, a few lines, especially in large caches, exhibit multi-bit failures and increase Vccmin. Previous solutions either significantly reduce cache capacity to enable uniform error correction across all lines, or significantly increase latency and bandwidth overheads when amortizing the cost of error-correcting codes (ECC) over large lines. In this paper, we propose a novel cache architecture that uses variable-strength error-correcting codes (VS-ECC). In the common case, lines with zero or one failures use a simple and fast ECC. A small number of lines with multi-bit failures use a strong multi-bit ECC that requires some additional area and latency. We present a novel dynamic cache characterization mechanism to determine which lines will exhibit multi-bit failures. In particular, we use multi-bit correction to protect a fraction of the cache after switching to low voltage, while dynamically testing the remaining lines for multi-bit failures. Compared to prior multi-bit-correcting proposals, VS-ECC significantly reduces power and energy, avoids significant reductions in cache capacity, incurs little area overhead, and avoids large increases in latency and bandwidth.
Starting Page	461
Ending Page	472
Page Count	12
File Format	PDF MP4
ISSN	01635964
DOI	10.1145/2024723.2000118
Journal	ACM SIGARCH Computer Architecture News (CARN)
Volume Number	39
Issue Number	3
Language	English
Publisher	Association for Computing Machinery (ACM)
Publisher Date	1981-04-01
Publisher Place	New York
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	Low-voltage design Error-correcting codes Variable-strength codes Cache design
Content Type	Audio Text
Resource Type	Article

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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