NDLI: Thickness and Composition Tailoring of K- and Ka-Band Microwave Absorption of BaCo$_{ x }$Ti$_{ x }$Fe$_{(12−2x)}$O$

Content Provider	Springer Nature Link
Author	Narang, Sukhleen Bindra Pubby, Kunal Singh, Charanjeet
Copyright Year	2016
Abstract	The goal of this research is to investigate the electromagnetic and microwave absorption properties of M-type barium hexaferrites with chemical formula BaCo$_{ x }$Ti$_{ x }$Fe$_{(12−2x)}$O$_{19}$ (x = 0.0, 0.2, 0.4, 0.6, 0.8, 1.0) in K and Ka band. Characterization techniques such as x-ray diffraction analysis and scanning electron microscopy were applied to confirm ferrite formation. The frequency dependence of the complex permittivity and complex permeability was studied for prepared ferrite samples in the frequency range from 18 GHz to 40 GHz. Factors such as the quarter-wavelength condition, impedance matching, high dielectric–magnetic losses, as well as ferromagnetic resonance were investigated to determine their contribution to the absorption characteristics. It was found that the quarter-wavelength (λ/4) model could be successfully applied to predict and understand the position as well as number of reflection peaks in the microwave absorption spectrum. The origin of the reflection loss peaks is explained and verified based on calculations of input impedance, loss tangent, and ferromagnetic resonance. Reflection loss analysis revealed that all six compositions exhibited reflection loss peaks (absorption >90%) at their matching thicknesses and frequencies. Therefore, these ferrites are potential candidates for use in electromagnetic shielding applications requiring low reflectivity in K and Ka band.
Starting Page	718
Ending Page	728
Page Count	11
File Format	PDF
ISSN	03615235
Journal	Journal of Electronic Materials
Volume Number	46
Issue Number	2
e-ISSN	1543186X
Language	English
Publisher	Springer US
Publisher Date	2016-10-26
Publisher Place	New York
Access Restriction	One Nation One Subscription (ONOS)
Subject Keyword	Electromagnetic properties K and Ka band reflection loss quarter-wavelength condition impedance matching complex thickness Optical and Electronic Materials Characterization and Evaluation of Materials Electronics and Microelectronics, Instrumentation Solid State Physics
Content Type	Text
Resource Type	Article
Subject	Materials Chemistry Electronic, Optical and Magnetic Materials Condensed Matter Physics Electrical and Electronic Engineering

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