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Valence force-field geometry and electronic states of the 90° partial dislocation in silicon
| Content Provider | Scilit |
|---|---|
| Author | Lapiccirella, A. Altmann, S. L. |
| Copyright Year | 2020 |
| Description | Book Name: Microscopy of Semiconducting Materials, 1983 |
| Related Links | https://content.taylorfrancis.com/books/download?dac=C2006-0-01873-7&isbn=9781003069614&doi=10.1201/9781003069614-8&format=pdf |
| Ending Page | 58 |
| Page Count | 4 |
| Starting Page | 55 |
| DOI | 10.1201/9781003069614-8 |
| Language | English |
| Publisher | Informa UK Limited |
| Publisher Date | 2020-11-25 |
| Access Restriction | Open |
| Subject Keyword | Book Name: Microscopy of Semiconducting Materials, 1983 Applied Physics Condensed Matter Physics Gap Structure Dislocation Valence Partial Reconstructed Spurious Bottom Lifted |
| Content Type | Text |
| Resource Type | Chapter |