NDLI: Soft fault diagnosis of non-linear circuits having multiple DC solutions

Content Provider	IET Digital Library
Author	Tadeusiewicz, Michał Hałgas, Stanisław
Abstract	This study deals with a single soft fault diagnosis of non-linear circuits having multiple DC solutions. The key problem of the diagnosis is arranging a measurement test. Creation of the test for the above-defined class of circuits is discussed in detail. It is assumed that only input and output terminals are accessible in the circuit. The test is created based on some single-valued input or transfer characteristics traced in a modified circuit. The modification does not disturb the integrity of the circuit and is realised by connecting some components to the accessible terminals. A very fast method for tracing the characteristics is developed. Having appropriate characteristics several values of the exciting voltage are chosen and the corresponding values of voltage or current defined by the characteristic are measured in the course of testing. The method for arranging the measurement test is illustrated using four non-linear circuits having multiple DC solutions and three of them were built in bipolar and complementary metal-oxide-semiconductor (CMOS) technology. One of the circuits is comprehensibly diagnosed using a method for detecting, locating, and estimating values of different faulty parameters exploiting the proposed test.
Starting Page	1220
Ending Page	1227
Page Count	8
ISSN	1751858X
Volume Number	14
e-ISSN	17518598
Issue Number	Issue 8, Nov (2020)
Alternate Webpage(s)	https://digital-library.theiet.org/content/journals/iet-cds/14/8
Alternate Webpage(s)	https://digital-library.theiet.org/content/journals/10.1049/iet-cds.2020.0197
Journal	IET Circuits, Devices & Systems
Publisher Date	2020-08-17
Access Restriction	Open
Rights Holder	© The Institution of Engineering and Technology
Subject Keyword	Bipolar Technology CMOS Integrated Circuit CMOS Technology Exciting Voltage Fault Diagnosis Input-output Terminals Integrated Circuit Testing Layout Measurement Test Modelling And Testing Modified Circuit Multiple DC Solutions Nonlinear Circuit Nonlinear Network Analysis Nonlinear Network Analysis And Design Semiconductor Integrated Circuit Design Single Soft Fault Diagnosis
Content Type	Text
Resource Type	Article
Subject	Control and Systems Engineering Electrical and Electronic Engineering

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