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| Content Provider | IET Digital Library |
|---|---|
| Author | Sun, Dapeng Zhang, Tan Tan Law, Man Kay Mak, Pui In Martins, Rui Paulo |
| Abstract | A bipolar junction transistor (BJT)-based CMOS temperature sensor exploiting the piecewise BJT process spread compensation property of the base recombination current is proposed to reduce the process variations of the base–emitter voltage (V be). The weighted combinations of different on-chip resistors are explored to minimise their associated process spread. Fabricated in standard 0.18-μm CMOS, the chip prototype occupies an active area of 0.036 mm2 and draws 3 μA from a 1.2 V supply, with a measured maximum inter-/intra-die variation in V be of <1.5 mV from −40 to 125°C from two batches. Using the measured V be, ΔV be and the first-batch-only calibration parameters, the chip prototype demonstrates an untrimmed batch-to-batch inaccuracy of ± 1.5°C (3σ) within the same temperature range (24 samples from 2 batches). |
| Starting Page | 1270 |
| Ending Page | 1272 |
| Page Count | 3 |
| ISSN | 00135194 |
| Volume Number | 54 |
| e-ISSN | 1350911X |
| Issue Number | Issue 22, Nov (2018) |
| Alternate Webpage(s) | https://digital-library.theiet.org/content/journals/el/54/22 |
| Alternate Webpage(s) | https://digital-library.theiet.org/content/journals/10.1049/el.2018.6447 |
| Journal | Electronics Letters |
| Publisher Date | 2018-09-18 |
| Access Restriction | Open |
| Rights Holder | © The Institution of Engineering and Technology |
| Subject Keyword | Base Recombination Current Base–emitter Voltage Batch-to-batch Inaccuracy Bipolar Transistor Calibration CMOS Integrated Circuit CMOS Temperature Sensor Compensation Property Current 3.0 MuA First-batch-only Calibration Parameter Inter-die Variation Intra-die Variation On-chip Resistors Piecewise BJT Process Process Compensated BJT Resistor Sensing Device And Transducers Size 0.036 Mm Spread Compensation Property Temperature -40 DegC to 125 DegC Temperature Sonsor Voltage 1.2 V |
| Content Type | Text |
| Resource Type | Article |
| Subject | Electrical and Electronic Engineering |
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