NDLI: Thermal analysis of electron gun with grid control in pulsed TWT

Content Provider	IEEE Xplore Digital Library
Author	Li Xiaofeng Wang Junyi Xu hui
Copyright Year	2004
Description	Author affiliation: Nanjin Sank group Co. Ltd, China (Li Xiaofeng; Wang Junyi; Xu hui)
Abstract	Summary form only given. The design of electron optical system of electron gun with grid control in pulsed TWT has been completed. During the cathode of grid control electron gun, shadow grid and control grid are radiated, it is necessary to further analyze change of electrode temperature and displacement with the help of CAD technique. Selected material of support piece and integrative heating cathode are analyzed by calculation. These conclusions are gained such as the variation of cathode surface temperature in the range of 10/spl deg/C, the highest temperature of shadow grid to be radiated at 707 /spl deg/C, the temperature of mat edging being lower and the highest surface temperature of control grid at 193/spl deg/C-far below the surface temperature of shadow grid. After cathode heat balance, each electrode will produce expand and displacement so it will result in change of original gap each electrode. By means of CAD analysis, cathode, shadow grid and control grid will produce displacement of 0.06mm ,0.036mm and 0.00875mm respectively when they come under the influence of thermal radiation. So assembling size of electron gun with grid control can be obtained by means of modifying electron optical size. Tests of temperature and displacement of electron gun with grid control are measuring surface temperature each electrode with the aid of micro-optical thermal detector and axial displacement each electrode with the aid of tool microscope. And the assembled electron gun is sealed in glass shell through exhaust. Test data are corresponding with calculating results of CAD.
File Size	39810
File Format	PDF
ISBN	0780384377
DOI	10.1109/IVESC.2004.1414186
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2004-09-06
Publisher Place	China
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Electrodes Temperature distribution Displacement control Electron optics Temperature control Assembly Cathodes Optical pulses Optical control Testing
Content Type	Text
Resource Type	Article

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