NDLI: Stretched exponential behavior of degradation in oxide cathodes

Content Provider	IEEE Xplore Digital Library
Author	Byung Mook Weon Jung Ho Je
Copyright Year	2004
Description	Author affiliation: LG Philips Displays, Gutni, South Korea (Byung Mook Weon)
Abstract	We investigated degradation behavior of oxide cathodes in CRTs. The excess (or free) Ba enrichment process on the surface of oxide cathode, which starts to be induced from activation process, is a complex phenomenon which includes electrolytic transport, chemical reduction, and boundary diffusion, etc. We reveal that degradation behavior of oxide cathodes, which is directly related with the free Ba enrichment process, is able to be described by the stretched exponential model that has been successfully used to describe the complex dynamics of various systems. We derive a simple longevity equation, which depends on two parameters of stretched exponential model: i) characteristic life and ii) stretched exponent. We demonstrate that degradation factors, for example, temperature, can significantly affect the two parameters and in turn longevity. It is interesting that oxide cathodes, which have been applied as electron sources for /spl sim/100 years, can be described as dynamics of complex systems in modern physics.
Starting Page	100
Ending Page	103
File Size	291450
Page Count	4
File Format	PDF
ISBN	0780384377
DOI	10.1109/IVESC.2004.1414149
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2004-09-06
Publisher Place	China
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Degradation Temperature dependence Materials science and technology Cathode ray tubes Displays Modems Chemical processes Mathematical model Electron sources Equations
Content Type	Text
Resource Type	Article

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