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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Slattery, A.D. Gibson, C.T. Quinton, J.S. |
| Copyright Year | 2010 |
| Description | Author affiliation: Smart Surface Structures Group, School of Chemical and Physical Sciences, Flinders University, Sturt Road, Bedford Park, Adelaide, SA 5001, Australia (Slattery, A.D.; Gibson, C.T.; Quinton, J.S.) |
| Abstract | The development of an improved method for calibrating AFM cantilevers is presented, based on the Cleveland method. A masking technique is used to deposit gold on the very end of the cantilever, and the shift in resonant frequency with added mass is used to calculate the spring constant. A novel and unique application of scanning Raman microscopy was developed to measure the thickness distribution of the deposited gold film over the cantilever. The uncertainty in the spring constant of cantilevers calibrated using this method was determined to be ∼10%, and in good agreement with established calibration methods in literature. |
| Starting Page | 407 |
| Ending Page | 410 |
| File Size | 286163 |
| Page Count | 4 |
| File Format | |
| ISBN | 9781424452613 |
| DOI | 10.1109/ICONN.2010.6045265 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2010-02-22 |
| Publisher Place | Australia |
| Access Restriction | Subscribed |
| Rights Holder | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Subject Keyword | Gold Films Microscopy Silicon Calibration Springs Thickness measurement |
| Content Type | Text |
| Resource Type | Article |
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