NDLI: Validation of differential light emission analysis on FPGA

Content Provider	IEEE Xplore Digital Library
Author	Di Battista, J. Perdu, P. Courrege, J.-C. Rouzeyre, B. Torres, L.
Copyright Year	2009
Description	Author affiliation: THALES ISS, 18 avenue Edouard Belin, 31401 Toulouse, France (Di Battista, J.; Courrege, J.-C.) \|\| LIRMM, UMR 5506, University Montpellier 2, CNRS, 161, rue Ada, 34392, France (Rouzeyre, B.; Torres, L.) \|\| CNES, 18 avenue Edouard Belin, 31401 Toulouse, France (Perdu, P.)
Abstract	Failure analysis tools and methods can be used for security purposes as well as the security attack techniques can be used in failure analysis. In this paper, we describe the last results obtained concerning light emission techniques and their use to set up a side channel methodology. From a cryptanalyst standpoint, the light emission could be a potential source of leakage. When studying a specific cipher algorithm implemented in a device, by analysing this new kind of leakage it is possible to retrieve secret sensitive data. We made our analyses on an FPGA device, which makes the attack harder to perform than on a standard ASIC. Furthermore, the technique was validated on a device in 0.13µm technology, resulting in a more complex sample preparation from backside. We will show that, the leakage due to the light emitted during normal operation of a CMOS circuit, can be used to set up an attack based on the well-known DPA technique.
Starting Page	1
Ending Page	5
File Size	552321
Page Count	5
File Format	PDF
ISBN	9781424443970
DOI	10.1109/ICSCS.2009.5412598
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-11-06
Publisher Place	Tunisia
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Costs Microcontrollers FPGA Information retrieval Security MOSFETs Application specific integrated circuits DES cipher Optical microscopy Light emission DPA Failure analysis Side-channel Signal analysis Field programmable gate arrays
Content Type	Text
Resource Type	Article

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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