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| Content Provider | IEEE Xplore Digital Library |
|---|---|
| Author | Puyoo, E. Grauby, S. Rampnoux, J. Claeys, W. Rouviere, E. Dilhaire, S. |
| Copyright Year | 2010 |
| Description | Author affiliation: CPMOH, Université Bordeaux 1, 351, cours de la Libération, 33405 Talence cedex, France (Puyoo, E.; Grauby, S.; Rampnoux, J.; Claeys, W.; Dilhaire, S.) || CEA - DRT/LITEN/DTNM, LCH, 17 Rue des Martyrs, 38 054 Grenoble cedex (Rouviere, E.) |
| Abstract | In Scanning Thermal Microscopy (SThM) techniques, the probe, and more particularly the tip, plays a major role in the spatial resolution limitation and in the acquisition speed. We present a new commercial resistive SThM probe constituted of a Palladium (Pd) film on a SiO2 substrate. We first describe its geometry and electrical properties. Then, we present topographic and thermal images of silicon nanowires, which show the very good spatial resolution (<100nm) and the high acquisition speed obtained with this probe. To extract thermal parameters from a thermal image, a calibration of the probe is necessary. Hence, we propose a model for the probe and we finally use it to identify its geometric, electrical and thermal parameters. |
| Starting Page | 1 |
| Ending Page | 6 |
| File Size | 1074727 |
| Page Count | 6 |
| File Format | |
| ISBN | 9781424484539 |
| e-ISBN | 9782355000126 |
| Language | English |
| Publisher | Institute of Electrical and Electronics Engineers, Inc. (IEEE) |
| Publisher Date | 2010-10-06 |
| Publisher Place | Spain |
| Access Restriction | Subscribed |
| Rights Holder | EDA Publishing |
| Subject Keyword | Temperature measurement Resistance Heating Thermal conductivity Nanowires Probes Spatial resolution |
| Content Type | Text |
| Resource Type | Article |
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