NDLI: Defect Detection Rate through IDDQ for Production Testing

Content Provider	IEEE Xplore Digital Library
Author	Hirase, J.
Copyright Year	2008
Description	Author affiliation: Japan Sci. & Technol. Agency (Hirase, J.)
Abstract	With the miniaturization of the diffusion process, the leak current per transistor tends to increase and the number of transistors per die tends to become larger, thus rendering more difficult the discrimination through the absolute value of IDDQ (quiescent power supply current) that is required to detect defects on VLSI (Very Large Scale Integration). While various statistical methods have been disclosed, this paper describes first the effects of an increase in the average value of IDDQ due to process dispersion on the IDDQ distribution and presents a theorization to estimate the defect detection rate of various IDDQ testing methods. Corroborative results will then show the validity of the presented theory on the defect detection rate of IDDQ.
Starting Page	199
Ending Page	205
File Size	331479
Page Count	7
File Format	PDF
ISBN	9780769533964
ISSN	10817735
DOI	10.1109/ATS.2008.88
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-11-24
Publisher Place	Japan
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Production Testing Very large scale integration Diffusion processes Current supplies Power supplies Leak detection Statistical analysis Dispersion Estimation theory Performance index IDDQ Gamma distribution Defect detection rate Exponential distribution Product of average defective current
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering

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1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

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