NDLI: Low-Cost One-Port Approach for Testing Integrated RF Substrates

Content Provider	IEEE Xplore Digital Library
Author	Goyal, A. Swaminathan, M.
Copyright Year	2008
Description	Author affiliation: Dept. of Electr. & Comput. Eng., Georgia Inst. of Technol., Atlanta, GA (Goyal, A.; Swaminathan, M.)
Abstract	Low-cost testing of integrated RF substrates is necessary to reduce their production cost. In this paper a new low-cost test approach is proposed for testing an integrated RF substrate with embedded RF passive filters. As compared to a conventional test method the proposed test method reduces the test-setup cost by around 40%. The proposed method enables testing of embedded RF filters by one-port measurement. Also, this method does not require a vector network analyzer and allows testing of these embedded RF circuits without any external test stimulus. Hence, this method brings about a significant reduction in the test cost. The proposed method uses a shift in the oscillation frequency of the test setup for testing embedded filters, but it does not require reconfiguration or conversion of filters into an oscillator as it is done in conventional oscillation-based test methods. The core principle of the method is to include embedded passive filters through one-port substrate surface probe into an external RF oscillator, located on the probe card. Such one-port probing causes a shift in the oscillation frequency of the oscillator because of the loading from the RF filter. The failures in the RF filter are detected by monitoring the shift in the oscillation frequency of the RF oscillator. The test method is demonstrated with both simulations and measurements. Also, wafer-level testing of an integrated RF substrate is illustrated.
Starting Page	49
Ending Page	54
File Size	1106087
Page Count	6
File Format	PDF
ISBN	9780769533964
ISSN	10817735
DOI	10.1109/ATS.2008.56
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2008-11-24
Publisher Place	Japan
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Radio frequency Circuit testing Oscillators Costs Passive filters Probes Production Integrated circuit measurements Frequency conversion Condition monitoring Embedded RF Passive Filters Testing Integrated RF Substrates Low-Cost Method Resonance Based Test
Content Type	Text
Resource Type	Article
Subject	Electrical and Electronic Engineering

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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