NDLI: Panel Synopsis - How (Un)affordable is true cost of test?

Content Provider	IEEE Xplore Digital Library
Author	Parekhji, Rubin A.
Copyright Year	2009
Description	Author affiliation: Texas Instruments (India) Pvt. Ltd., Bangalore, INDIA (Parekhji, Rubin A.)
Abstract	Test cost means different things to different teams at different times, in terms of investment, spending and affordability. Long design and production life-time cycles continue to give rise to scenarios where, while the test cost estimated at design time was considered expendable, the actual test cost incurred during production was not, resulting in debates, analysis and optimisations, (often implemented grossly and sub-optimally, due to lack of planning and lack of support in design as well as test infrastructure). Besides, as the life-cycle expands, i.e. devices are manufactured, sold and supported over a longer time period, the impact of test cost (as a percentage of manufacturing cost) on profitability can be even more profound. The adoption of the right techniques and infrastructure to guarantee functionality upon manufacturing, and during the operation life-cycle (as applicable) is crucial for profitability. Design support is often the most important enabler. Correspondingly, this drives the extent and scope of the functionality in the manufactured chip to be verified, the selection of tests for this verification, and the total number of chips being subjected to such tests. Test cost is perceptibly incurred “after manufacturing” and, in different contexts, considered “dispensable”. As a result, it is a big variable and often the target of ongoing optimisations. The lesser the affordability, (dependent on what is considered essential versus what is considered as an overhead), the higher is the focus on such optimisations. Good test cost models and estimates can, therefore, help to set the right bounds on affordability and optimisations.
Starting Page	1
Ending Page	2
File Size	80028
Page Count	2
File Format	PDF
ISBN	9781424448685
ISSN	10893539
DOI	10.1109/TEST.2009.5355819
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	2009-11-01
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Automatic testing Manufacturing Life testing Cost function Production System testing Chip scale packaging Instruments Design optimization Profitability
Content Type	Text
Resource Type	Article
Subject	Applied Mathematics Electrical and Electronic Engineering

Sl.	Authority	Responsibilities	Communication Details
1	Ministry of Education (GoI), Department of Higher Education	Sanctioning Authority	https://www.education.gov.in/ict-initiatives
2	Indian Institute of Technology Kharagpur	Host Institute of the Project: The host institute of the project is responsible for providing infrastructure support and hosting the project	https://www.iitkgp.ac.in
3	National Digital Library of India Office, Indian Institute of Technology Kharagpur	The administrative and infrastructural headquarters of the project	Dr. B. Sutradhar bsutra@ndl.gov.in
4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
5	Website/Portal (Helpdesk)	Queries regarding NDLI and its services	support@ndl.gov.in
6	Contents and Copyright Issues	Queries related to content curation and copyright issues	content@ndl.gov.in
7	National Digital Library of India Club (NDLI Club)	Queries related to NDLI Club formation, support, user awareness program, seminar/symposium, collaboration, social media, promotion, and outreach	clubsupport@ndl.gov.in
8	Digital Preservation Centre (DPC)	Assistance with digitizing and archiving copyright-free printed books	dpc@ndl.gov.in
9	IDR Setup or Support	Queries related to establishment and support of Institutional Digital Repository (IDR) and IDR workshops	idr@ndl.gov.in

Test infrastructures evaluation at transaction level

Panel synopsis - How (Un)affordable is true cost of test?

Defect coverage of non-intrusive board tests (NBT): What does it mean when a non-intrusive board test passes?

How (Un)affordable is the true cost of test?

How much testing is enough

Trends in SLI design and their effect on test

Is DFT right for you?

Production Test of High Volume Commercial RFIC

Panel synopsis - how (In)adequate is one time testing?

Panel Synopsis - How (Un)affordable is true cost of test?

Similar Documents

Test infrastructures evaluation at transaction level

Panel synopsis - How (Un)affordable is true cost of test?

Defect coverage of non-intrusive board tests (NBT): What does it mean when a non-intrusive board test passes?

How (Un)affordable is the true cost of test?

How much testing is enough

Trends in SLI design and their effect on test

Is DFT right for you?

Production Test of High Volume Commercial RFIC

Panel synopsis - how (In)adequate is one time testing?

Panel Synopsis - How (Un)affordable is true cost of test?