NDLI: From specification to measurement: the bottleneck in analog industrial testing

Content Provider	IEEE Xplore Digital Library
Author	van Rijsinge, R.J. Haggenburg, A.A.R.M. de Vries, C. Wallinga, H.
Copyright Year	1990
Description	Author affiliation: Philips Components, Nijmegen, Netherlands (van Rijsinge, R.J.; Haggenburg, A.A.R.M.; de Vries, C.)
Abstract	The translation of the specification of an analog device into the necessary set of measurements to be carried out by an industrial test facility is discussed. Algorithms are developed to compute the number of test vectors needed to guarantee a certain parameter and to compare several possible test methods based on accuracy. It is shown that the specification of a circuit can be transformed into single-parameter measurements, to be carried out by an industrial test facility. There is a tradeoff between the number of measurements and the accuracy of the specified parameter. A computationally efficient tradeoff between test methods based on maximum accuracy can be made. One of the aspects needed to make these tradeoffs, the measurement error, can be predicted using one of the proposed experiments. There is a tradeoff between the complexity of the experiment and the accuracy of the error prediction.
Starting Page	177
Ending Page	182
File Size	385367
Page Count	6
File Format	PDF
ISBN	081869064X
DOI	10.1109/TEST.1990.114016
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1990-09-10
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Circuit testing Measurement errors Integrated circuit testing Analog integrated circuits Linearity Test facilities Analog circuits Voltage Oscillators Frequency
Content Type	Text
Resource Type	Article

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