NDLI: An histogram based procedure for current testing of active defects

Content Provider	IEEE Xplore Digital Library
Author	Thibeault, C.
Copyright Year	1999
Description	Author affiliation: Dept. of Electr. Eng, Ecole de Technol. Superieure, Montreal, Que., Canada (Thibeault, C.)
Abstract	The purpose of this paper is to propose a new histogram-based differential current testing procedure of active defects. This procedure contains three steps: Preanalysis, Failure Analysis, and Production Testing. The main objectives of the Pre-analysis are to provide information on the most frequent active current defects and to help setting the limits between faulty and fault-free devices; these limits are then investigated during the Failure Analysis step in order to set the threshold between faulty and fault-free ICs. During the Production Testing step, this threshold is compared to the highest peak value appearing in a histogram built for each tested IC. Some selected results are presented, which confirm the test quality gain increase by using differential I/sub DDQ/ instead of I/sub DDQ/ itself as well as the additional reduction of bad test decision that can be obtained by a wise selection of test vectors reducing the vector-to-vector current variations.
Starting Page	714
Ending Page	723
File Size	956400
Page Count	10
File Format	PDF
ISBN	0780357531
ISSN	10893539
DOI	10.1109/TEST.1999.805800
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1999-09-30
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Histograms Circuit testing Integrated circuit testing Electronic equipment testing Circuit faults Failure analysis Production CMOS technology Fault detection Leak detection
Content Type	Text
Resource Type	Article
Subject	Applied Mathematics Electrical and Electronic Engineering

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