NDLI: Robust test methods applied to functional design verification

Content Provider	IEEE Xplore Digital Library
Author	Stoica, S.
Copyright Year	1999
Description	Author affiliation: Res. & Vehicle Technol., Ford Motor Co., Dearborn, MI, USA (Stoica, S.)
Abstract	With the ever growing complexity and interaction of the vehicle functionalities, a reliable functional test methodology has become a major concern. In 1995, recognizing the need to develop a quality functional test process, Ford Motor Company started a concentrated effort to define for itself and its suppliers an effective test strategy for functionality verification, for which the Robust Test Method (RTM) presented in this paper is an important component. The strategy was successfully applied in Ford, in an environment that is extremely cost-conscious, demands high quality and fast test turnaround time. RTM was born out of the need of Japanese industry to establish its competitive capability after the Second World War by providing high quality products. Madhav Phadke brought the methodology to Ford Motor Company. The introduction of robust test methods into the test process translated into a quantum jump in the test quality, allowing the detection of previously undetected faults. This type of testing applied to subsystem level design verification yielded more errors detected than the module and system tests combined, while reducing the test turnaround time by 30%.
Starting Page	848
Ending Page	857
File Size	824431
Page Count	10
File Format	PDF
ISBN	0780357531
ISSN	10893539
DOI	10.1109/TEST.1999.805816
Language	English
Publisher	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Publisher Date	1999-09-30
Publisher Place	USA
Access Restriction	Subscribed
Rights Holder	Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Subject Keyword	Robustness Circuit testing System testing Vehicles Software testing Design for experiments Fault detection Design engineering Electronic equipment testing Automotive engineering
Content Type	Text
Resource Type	Article
Subject	Applied Mathematics Electrical and Electronic Engineering

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4	Project PI / Joint PI	Principal Investigator and Joint Principal Investigators of the project	Dr. B. Sutradhar bsutra@ndl.gov.in Prof. Saswat Chakrabarti will be added soon
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